CMOS blocks for on-chip RF test-Reference-Cited by-同舟云学术

CMOS blocks for on-chip RF test

Published:2006-09-19 Issue:2 Volume:49 Page:151-160
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Ramzan Rashad,Dąbrowski Jerzy

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

http://link.springer.com/content/pdf/10.1007/s10470-006-9615-2.pdf

Reference16 articles.

1. L. Milor, “A tutorial introduction to research on analog and mixed-signal circuit testing.” IEEE Transactions on CAS-II: Analog and Digital Signal Proceeding, vol. 45, no. 10, pp. 1398–1407, 1997.

2. A. Grochowski, et al., “Integrated circuits testing for quality assurance in manufacturing: History.” IEEE Transacstion on CAS-II: Analog and Digital Signal Proceeding, vol. 44, no. 8, pp. 610–633, 1997.

3. M. Heutmaker and D. Le, “An architecture for self-test of a wireless communication system using sampled IQ modulation and boundary scan.” IEEE Communication Mag., pp. 98–102, 1999.

4. D. Lupea, et al., “RF Bist: Loopback spectral signature analysis.” Proc. DATE’03, pp. 6.

5. G. Srinivasan et al., “Loopback test of RF transceivers using periodic bit sequences.” Proc. IMSTW’04, pp. 6

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