1. Xu peng, Zu jing, Fan jingbiao. The Influence of Stress Wave Propagation on High Acceleration Measurement of Projectile [J]. Journal of Test and Measurement Technology, 2006, 20: 41–45
2. Davies B R, Barron CC, Montague S, et al. High G MEMS Integrated Accelerometer[C]. SPIE Proceedings, 1997: 3046 52–62
3. Chu A. Technical Paper No 308, Endevco Corporation (1992) http: //www.endevco.com
4. Tanner D M, Walraven J A, Helgesen K, et al. MEMS Reliability in Impact Environments. IEEE International Reliability Physics Symposium Proceedings[C]. 2000 IEEE International Reliability Physics Symposium, San Joes USA Piscataway: IEEE, 2000: 129–138
5. RR Tummala, EJ Rymaszewi. Microelectronics Packaging Handbook[M]. Van Nostrand Reihold, New York, 1989