1. E. Spiller and R. Feder, in ?Topics in Applied Physics?, Vol. 22, ?X-ray Optics and Applications to Solids?, edited by H. J. Quiesser (Springer, Berlin, 1977) p. 35.
2. D. Sayre, J. Kirz, R. Feder, D. M. Kim, E. Spiller, Ann. N.Y. Acad. Sci. 306 (1978) 286.
3. D. M. Shinozaki and R. Feder, in ?Treatise in Materials Science and Technology?, Vol. 27, ?Analytical Techniques for Thin Films?, edited by K. N. Tu and R. Rosenberg (Academic Press, New York, 1988) p. 111.
4. J. Kirz and D. Sayre, in ?Synchrotron Radiation Research?, edited by H. Winick and S. Doniach (Plenum Press, New York, 1980) p. 277.
5. D. C. Flanders, Appl. Phys. Lett. 36(1) (1980) 93.