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5. ALFASSI, Z. B.; YANG, M. H.(National Tsing Hua Univ., Hsinchu, TW (China). Inst. of Nuclear Science): On the determination of phosphorus depth profile in phosphoruscoped silicon.J. Radioanal. Nucl. Chem. Articles. ISSN 0236-5731. JRNCD. (Jul 1989). v. 132(1) p. 99–104. (RN 21:03041).