Formation of antisite defects by gliding dislocations in sphalerite-structure crystals-Reference-Cited by-同舟云学术

Formation of antisite defects by gliding dislocations in sphalerite-structure crystals

Published:1982-12 Issue:4 Volume:29 Page:199-200
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Figielski T.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00615067.pdf

Reference8 articles.

1. M.Lannoo, J.Bourgoin:Point Defects in Semiconductors I, Springer Ser. Solid-State Sci.22 (Springer, Berlin, Heidelberg, New York 1981)

2. E.R.Weber, H.Ennen, U.Kaufmann, J.Windscheif, J.Schneider, T.Wosi?ski: Appl. Phys. Lett. (in press, 1982)

3. T.Wosi?ski, A.Morawski, T.Figielski: Appl. Phys. A (submitted)

4. D.V.Lang: InThermally Stimulated Relaxation in Solids, ed. by P.Br�unlich, Top. Appl. Phys.37 (Springer, Berlin, Heidelberg, New York 1979) Chap. 3

5. T.Wosi?ski: Phys. stat. sol. (a)60, K149 (1980)

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