Industrial product surface defect detection via the fast denoising diffusion implicit model
Author:
Funder
National Key Research and Development Program of China
Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s13042-024-02213-4.pdf
Reference47 articles.
1. Diez-Olivan A, Del Ser J, Galar D, Sierra B (2019) Data fusion and machine learning for industrial prognosis: trends and perspectives towards industry 4.0. Inform Fus 50:92–111
2. Chen J, Sun J, Wang G (2022) From unmanned systems to autonomous intelligent systems. Engineering 12:16–19
3. Schlosser T, Friedrich M, Beuth F, Kowerko D (2022) Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks. J Intell Manuf 33(4):1099–1123
4. Xu X, Lu Y, Vogel-Heuser B, Wang L (2021) Industry 4.0 and industry 5.0-inception, conception and perception. J Manuf Syst 61:530–535
5. Wilson JW, Tian GY (2007) Pulsed electromagnetic methods for defect detection and characterisation. NDT & E Int 40(4):275–283
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