Publisher
Springer Berlin Heidelberg
Reference12 articles.
1. B. Becker, and J. Hartmann. Optimal-Time Multipliers and C-Testability. Proceedings of the 2nd Annual Symposium on Parallel Algorithms and Architectures, pp.146–154, 1990.
2. B. Becker, and U. Sparmann. Computations over Finite Monoids and their Test Complexity. Theoretical Computer Science, pp.225–250, 1991.
3. R. Fritzemeier, J. Soden, R. K. Treece, and C. Hawkins. Increased CMOS IC stuck-at fault coverage with reduced IDDQ test sets. International Test Conference, pp.427–435, 1990
4. J. P. Hayes. On Realizations of Boolean Functions Requiring a Minimal or Near-Minimal Number of Tests. IEEE Trans. on Computers Vol. C-20, No. 12, pp.1506–1513, 1971.
5. G. Hotz. Eine Algebraisierung des Syntheseproblems von Schaltkreisen. EIK 1, 185–205, 209–231, 1965.