Laboratory characterization of bent monocrystal wafers for Bragg X-ray spectroscopy
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Published:2018-03-24
Issue:2
Volume:45
Page:255-268
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ISSN:0922-6435
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Container-title:Experimental Astronomy
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language:en
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Short-container-title:Exp Astron
Author:
Płocieniak Stefan, Szaforz ŻanetaORCID
Funder
Polska Akademia Nauk
Publisher
Springer Science and Business Media LLC
Subject
Space and Planetary Science,Astronomy and Astrophysics
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