XIPE: the X-ray imaging polarimetry explorer

Author:

Soffitta Paolo,Barcons Xavier,Bellazzini Ronaldo,Braga João,Costa Enrico,Fraser George W.,Gburek Szymon,Huovelin Juhani,Matt Giorgio,Pearce Mark,Poutanen Juri,Reglero Victor,Santangelo Andrea,Sunyaev Rashid A.,Tagliaferri Gianpiero,Weisskopf Martin,Aloisio Roberto,Amato Elena,Attiná Primo,Axelsson Magnus,Baldini Luca,Basso Stefano,Bianchi Stefano,Blasi Pasquale,Bregeon Johan,Brez Alessandro,Bucciantini Niccoló,Burderi Luciano,Burwitz Vadim,Casella Piergiorgio,Churazov Eugene,Civitani Marta,Covino Stefano,Curado da Silva Rui Miguel,Cusumano Giancarlo,Dadina Mauro,D’Amico Flavio,Rosa Alessandra De,Cosimo Sergio Di,Persio Giuseppe Di,Salvo Tiziana Di,Dovciak Michal,Elsner Ronald,Eyles Chris J.,Fabian Andrew C.,Fabiani Sergio,Feng Hua,Giarrusso Salvatore,Goosmann René W.,Grandi Paola,Grosso Nicolas,Israel Gianluca,Jackson Miranda,Kaaret Philip,Karas Vladimir,Kuss Michael,Lai Dong,Rosa Giovanni La,Larsson Josefin,Larsson Stefan,Latronico Luca,Maggio Antonio,Maia Jorge,Marin Frédéric,Massai Marco Maria,Mineo Teresa,Minuti Massimo,Moretti Elena,Muleri Fabio,O’Dell Stephen L.,Pareschi Giovanni,Peres Giovanni,Pesce Melissa,Petrucci Pierre-Olivier,Pinchera Michele,Porquet Delphine,Ramsey Brian,Rea Nanda,Reale Fabio,Rodrigo Juana Maria,Różańska Agata,Rubini Alda,Rudawy Pawel,Ryde Felix,Salvati Marco,de Santiago Valdivino Alexandre,Sazonov Sergey,Sgró Carmelo,Silver Eric,Spandre Gloria,Spiga Daniele,Stella Luigi,Tamagawa Toru,Tamborra Francesco,Tavecchio Fabrizio,Dias Teresa Teixeira,Adelsberg Matthew van,Wu Kinwah,Zane Silvia

Publisher

Springer Science and Business Media LLC

Subject

Space and Planetary Science,Astronomy and Astrophysics

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