Pulsed laser ablation of electrically insulated features in thin NiCr films-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Pulsed laser ablation of electrically insulated features in thin NiCr films

Published:2023-09-06 Issue:11-12 Volume:128 Page:5167-5177
ISSN:0268-3768
Container-title:The International Journal of Advanced Manufacturing Technology
language:en
Short-container-title:Int J Adv Manuf Technol

Author:

Mao Ningyue,Enrique Pablo D.,Peng Peng

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

Springer Science and Business Media LLC

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering

Link

https://link.springer.com/content/pdf/10.1007/s00170-023-12271-7.pdf

Reference37 articles.

1. Brown MS, Arnold CB (2010) Fundamentals of laser-material interaction and application to multiscale surface modification, Springer Series in Materials. Science 135:91–120. https://doi.org/10.1007/978-3-642-10523-4_4/COVER/

2. Kongsuwan P, Brandal G, Yao YL (2015) Laser induced porosity and crystallinity modification of a bioactive glass coating on titanium substrates. J Manuf Sci Eng 137(3):031004. https://doi.org/10.1115/1.4029566/376332

3. Esakkimuthu M, BalakrishnapillaiSuseela S, Sankararajan R, Gupta A, Rana G (2017) Laser patterning of thin film copper and ITO on flexible substrates for terahertz antenna applications. JLMN-J Laser Micro/Nanoengineering 12:313–320. https://doi.org/10.2961/jlmn.2017.03.0023

4. Arshak K, Morris D, Arshak A, Korostynska O (2006) Development of high sensitivity oxide based strain gauges and pressure sensors. J Mater Sci: Mater Electron 17:767–778. https://doi.org/10.1007/S10854-006-0013-4

5. Dankoco MD, Bènevent E, Bergeret E, Gallais L, Bendahan M (2014) Temperature sensor on flexible substrate patterned by laser ablation, Conference Proceedings - 10th International Conference on Advanced Semiconductor Devices and Microsystems. (pp. 1–4). IEEE. https://doi.org/10.1109/ASDAM.2014.6998634

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3