SXC control chart-Reference-Cited by-同舟云学术

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SXC control chart

Published:2006-01-03 Issue:5-6 Volume:30 Page:444-451
ISSN:0268-3768
Container-title:The International Journal of Advanced Manufacturing Technology
language:en
Short-container-title:Int J Adv Manuf Technol

Author:

Wu Zhang,Xie Ming,Liu Qingchuan,Zhang Yu

Publisher

Springer Science and Business Media LLC

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering

Link

http://link.springer.com/content/pdf/10.1007/s00170-005-0080-3.pdf

Reference14 articles.

1. Montgomery DC (2001) Introduction to statistical quality control. Wiley, Singapore

2. Western Electric (1956) Statistical quality control handbook. Western Electric Corporation, Indianapolis

3. Keats JB, Miskulin JD (1995) Statistical process control scheme design. J Qual Technol 27:214−225

4. Wu Z, Spedding TA (2000) A synthetic control chart for detecting small shifts in the process mean. J QualTechnol 32:32−38

5. Page ES (1954) Continuous inspection schemes. Biometrics 41:100−114

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An improved SPRT control chart for monitoring process mean;The International Journal of Advanced Manufacturing Technology;2010-04-29

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