On-machine measurement using a noncontact sensor based on a CAD model-Reference-Cited by-同舟云学术

On-machine measurement using a noncontact sensor based on a CAD model

Published:2006-03-16 Issue:7-8 Volume:32 Page:739-746
ISSN:0268-3768
Container-title:The International Journal of Advanced Manufacturing Technology
language:en
Short-container-title:Int J Adv Manuf Technol

Author:

Ko Tae Jo,Park Jung Whan,Kim Hee Sool,Kim Sun Ho

Publisher

Springer Science and Business Media LLC

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering

Link

http://link.springer.com/content/pdf/10.1007/s00170-005-0383-4.pdf

Reference15 articles.

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2. Owen JV (1991) CMMs on the shop floor. Manuf Eng, April, pp 66–70

3. Kim SH, Lee SJ, Kim OH (1998) The analysis of measuring error in OMM system. J KSPE 15(5):34–42

4. Kim SH, Kim IH (1996) The development and evaluation of OMM (on the machine measuring) system using scanning probe. J KSPE 13(10):71–77

5. Kim KD, Chung SC (1999) Design and analysis of 212 dimensional on-the-machine measuring and inspection system using touch trigger probes. J KSME 23(10):37–46

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