Tool wear monitoring using naïve Bayes classifiers-Reference-Cited by-同舟云学术

Tool wear monitoring using naïve Bayes classifiers

Published:2014-11-14 Issue:9-12 Volume:77 Page:1613-1626
ISSN:0268-3768
Container-title:The International Journal of Advanced Manufacturing Technology
language:en
Short-container-title:Int J Adv Manuf Technol

Author:

Karandikar Jaydeep,McLeay Tom,Turner Sam,Schmitz Tony

Publisher

Springer Science and Business Media LLC

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering

Link

http://link.springer.com/content/pdf/10.1007/s00170-014-6560-6.pdf

Reference29 articles.

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3. Kurada S, Bradley C (1997) A review of machine vision sensors for tool condition monitoring. Comp Ind 34:55–72

4. Rehorn AG, Jiang J, Orban PE (2005) State-of-the-art methods and results in tool condition monitoring: a review. Int J Adv Manuf Technol 26(7–8):693–710

5. Prickett PW, Johns C (1999) An overview of approaches to end milling tool monitoring. Int J Mach Tools Manuf 39:105–122

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