A lot inspection sampling plan based on EWMA yield index

Author:

Yen Ching-Ho,Aslam Muhammad,Jun Chi-Hyuck

Publisher

Springer Science and Business Media LLC

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering

Reference23 articles.

1. Aslam M, Azam M, Jun C-H (2013) A new lot inspection procedure based on exponentially weighted moving average. Int J Syst Sci. doi: 10.1080/00207721.2013.822128

2. Aslam M, Balamurali S, Jun C-H, Ahmad M, Rasool M (2012) Optimal designing of an Skip-V skip lot sampling plans with double sampling plan as reference plan. Int J Adv Manuf Technol 60:733–740

3. Aslam M, Huang S-R, Jun C-H, Ahmad M, Rasool M (2011) A reliability sampling plan based on progressive interval censoring under Pareto distribution of second kind. Ind Eng & Manag Syst 10(2):154–160

4. Aslam M, Lio YL, Jun C-H (2013) Repetitive acceptance sampling plans for burr type XII percentiles. Int J Adv Manuf Technol 68:495–507

5. Aslam M, Wu CW, Azam M, Jun C-H (2013) Variable sampling inspection for resubmitted lots based on process capability index C pk for normally distributed items. Appl Math Model 37:667–675

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