Optimal test capacity allocation in automated high-frequency testing environments
Author:
Publisher
Springer Science and Business Media LLC
Subject
Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering
Link
http://link.springer.com/content/pdf/10.1007/s00170-011-3768-6.pdf
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4. Bitran G, Gilbert S (1994) Co-production processes with random yields in the semiconductor industry. Oper Res 42:476–491
5. Jula P, Leachman R (2008) Coordinating decentralized local schedulers in complex supply chain manufacturing. Ann Oper Res 161:123–147
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