Guest editorial: learning to organize testing

Author:

Bener Ayse,Menzies Tim

Publisher

Springer Science and Business Media LLC

Subject

Software

Reference9 articles.

1. Boehm, B., Basili, V.: Software defect reduction top 10 list. IEEE Comput. 34(1), 135–137 (2001). http://www.cs.umd.edu/projects/SoftEng/ESEG/papers/82.78.pdf

2. Fenton, N.E., Neil, M., Marsh, W., Hearty, P., Radlinski, L., Krause, P.: On the effectiveness of early life cycle defect prediction with Bayesian nets. J. Empir. Soft. Eng. 499–537 (2008)

3. Lessmann, S., Baesens, B., Mues, C., Pietsch, S.: Benchmarking classification models for software defect prediction: a proposed framework and novel findings. In: IEEE TSE, July 2008, pp. 485–496 (2008)

4. Menzies, T., Greenwald, J., Frank, A.: Data mining static code attributes to learn defect predictors. In: IEEE TSE 2007, January, pp. 2–13 (2007)

5. Menzies, T., Milton, Z., Turhan, B., Cukic, B., Jiang, Y., Bener, A.: Defect prediction from static code features: current results,imitations, new approaches. J. Autom. Softw. Eng. (2010). http://menzies.us/pdf/10which.pdf

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1. Predicting defective modules in different test phases;Software Quality Journal;2014-05-07

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