Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy-Reference-Cited by-同舟云学术

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Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy

Published:2004 Issue: Volume: Page:323-355
ISSN:0933-033X
Container-title:Nondestructive Materials Characterization
language:
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Author:

Druffner C.,Schumaker E.,Sathish S.,Frankel G. S.,Leblanc P.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-662-08988-0_12

Reference68 articles.

1. Park Scientific Instruments (1997) A Practical Guide to Scanning Probe Microscopy

2. Digital Instruments (1996) DimensionTM 3000 Scanning Probe Microscope Instruction Manual

3. Bhushan et al. (1995) Handbook of Micro/ Nano Tribology: CRC Series Mechanics and Material Science, CRC Press, New York

4. Binning G C.F. Quate CF, Gerber Ch (1986) Phys Rev Lett 56:930

5. Sarid D (1991) Scanning Force Microscopy. Oxford University Press, New York

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. “Moore’s Law” of NDE;Handbook of Nondestructive Evaluation 4.0;2022

2. “Moore’s Law” of NDE;Handbook of Nondestructive Evaluation 4.0;2021

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