1. Henke, B. L.: X-ray optics and microanalysis (ed. R. Castaing, P. Deschamps, and J. Philibert), p. 440. Paris: Hermann 1966.
2. Sterk, A. A.: Advances in X-ray analysis, vol. 8, p. 189. New York: Plenum Press 1965.
3. Sterk, A. A.: Advances in X-ray analysis, vol. 9, p. 410. New York: Plenum Press 1966.
4. C. L. Marks, and W. P. Saylor: Advances in X-ray analysis, vol. 10, p. 399. New York: Plenum Press 1967.
5. Green, M.: X-ray optics and X-ray microanalysis (ed. H. H. Pattee, V. E. Cosslett, and A. Engström), p. 185. New York: Academic Press 1963.