Space Radiation Aspects of Silicon Bipolar Technologies
Author:
Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-662-04974-7_5
Reference54 articles.
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4. Dale CJ, Marshall PW, Summers GP, Wolicki EA (1989) Displacement damage equivalent to dose in silicon devices. Appl Phys Lett 54: 451–453
5. Dale C, Marshall P (1991) Displacement damage in Si imagers for space applications. In: Proc SPIE Charged-Coupled Devices and Solid State Optical Sensors II, vol 1447, pp 70–86
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