1. J.A. Venables, D.J. Smith, J.M. Cowley: HREM, STEM, REM SEM and STM, Surf. Sci. 181, 235 (1987), see also J.A. Venables: Ultramicroscopy 7, 81 (1981)
2. A. Howie, U. Valdre (eds.): Surface and Interface Characterization by Electron Optical Methods; Proc. NATO ASI, Erice 1987 (Plenum, New York 1988)
3. P.K. Larson, P.J. Dobson (eds.): Reflection High-Energy Electron Diffraction and Reflection Imaging of Surfaces, Proc. NATO ASI, Veldhoven 1987 (Plenum, New York 1988)
4. J.A. Venables, D.J. Smith (eds.): Proceedings of Workshop on Surfaces and Surface Reactions, Wickenberg Inn, Arizona, 1989: Ultramicroscopy 31 (1989)
5. P.J. Goodhew: Electron Microscopy and Analysis (Wykeham, London 1975);