Multi-Method High-Resolution Surface Analysis with Slow Electrons
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-662-07766-5_8
Reference43 articles.
1. Bauer E. (1994) Surface electron microscopy: The first thirty years. Surf Sci 299 /300: 102–115
2. Bauer E. (1998) LEEM basics. Surf Rev Lett 5: 1275–1286
3. Bauer E. (1994) Low energy electron microscopy. Rep Prog Phys 57: 895–938
4. Herlt H.-J. (1982) Elastische Rückstreuung sehr langsamer Elektronen an reinen and an gasbedeckten Wolfram-Einkristalloberflächen. Ph.D. Thesis, Technical University Clausthal, Clausthal, Germany
5. Feibelman P.J., Eastman D.E. (1974) Photoemission spectroscopy — correspondence between quantum theory and experimental phenomenology. Phys Rev B 10: 4932–4947
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