Wir erhöhen die Vergrößerung
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Publisher
Springer Berlin Heidelberg
Link
https://link.springer.com/content/pdf/10.1007/978-3-662-66723-1_7
Reference16 articles.
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4. Möbus, G., Phillipp, F., Gemming, T., Schweinfest, R., Rühle, M.: Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high-voltage atomic resolution microscope. J. Electron Microsc. 46(5), 381–395 (1997)
5. Rose, H.: Correction of aberrations, a promising means for improving the spatial and energy resolution of energy-filtering electron microscopes. Ultramicroscopy 56, 11–25 (1994)
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