1. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology – Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200:2008; it is usually called “VIM 3” http://www.bipm.org/en/publications/guides/vim.html
2. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology – Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200:2008; it is usually called “VIM 3” http://www.bipm.org/en/publications/guides/vim.html entry 2.9
3. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology – Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200:2008; it is usually called “VIM 3” http://www.bipm.org/en/publications/guides/vim.html entry 2.9, Note 2
4. De Bièvre P (2009) Manufacturing a chain logically starts with manufacturing the first link, thus is logically started a metrological traceability chain. Accred Qual Assur 14:517–519
5. De Bièvre P (2009) Ensuring the potential for an intended quality of a measurement result must be done before and during the measurement, not after it (when it is too late). Accred Qual Assur 14:351–352