Metrological compatibility—a key issue in future accreditation-Reference-Cited by-同舟云学术

Metrological compatibility—a key issue in future accreditation

Published:2010-08-03 Issue:11 Volume:15 Page:643-645
ISSN:0949-1775
Container-title:Accreditation and Quality Assurance
language:en
Short-container-title:Accred Qual Assur

Author:

Heydorn Kaj

Publisher

Springer Science and Business Media LLC

Subject

Safety, Risk, Reliability and Quality,Instrumentation,General Chemical Engineering,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s00769-010-0691-8.pdf

Reference11 articles.

1. BIPM, IEC, IFCC, ISO, ILAC, IUPAC, IUPAP, OIML (2008) International Vocabulary of Metrology; basic and general concepts and associated terms—VIM, JCGM 200: 3rd edn. Available online at: http://www.bipm.org/en/publications/guides/vim.html

2. ISO/IEC 17025 (2004) General requirements for the competence of testing and calibration laboratories. International Organization for Standardization, Geneva

3. Heydorn K, Madsen BS (2005) Accred Qual Assur 10:403–408

4. Anglov T et al (2003) Accred Qual Assur 8:225–230

5. Heydorn K, Nørgaard K (1973) J Radioanal Chem 15:683–693

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