In-situ spectroscopic ellipsometry of HgCdTe

Author:

Benson J. D.,Cornfeld A. B.,Martinka M.,Singley K. M.,Derzko Z.,Shorten P. J.,Dinan J. H.,Boyd P. R.,Wolfgram F. C.,Johs B.,He P.,Woollam John A.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference14 articles.

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4. D.R. Rhiger,J. Electron. Mater. 22, 887 (1992).

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