Measurements of optical parameters of antimony trisulphide films-Reference-Cited by-同舟云学术

Measurements of optical parameters of antimony trisulphide films

Published:1968-06 Issue:6 Volume:18 Page:795-800
ISSN:0011-4626
Container-title:Czechoslovak Journal of Physics
language:en
Short-container-title:Czech J Phys

Author:

Kučírek J.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF01696141.pdf

Reference15 articles.

1. Vašíček A.: Optics of Thin Films. North-Holland Publ. Co., Amsterdam, 1960.

2. Vašíček A.: Optical Study of Thin Absorbing Film on Metal Surface, in the book “Ellipsometry in the Measurement of Surfaces and Thin Films”, Symposium Proceedings, Washington 1963. NBS Miscellaneous Publ. 256, Washington 1964, p. 25.

3. Vašíček A.: Théorie de Maxwell et optique d'une couche metallique mince, Journ. Physique,25 (1964), 183.

4. Vašíček A., Kučírek J.: Zum Problem der Messung der Dicke und der optischen Konstanten dünner Schichten,in the book “Grundprobleme der Physik dünner Schichten”, Vandenhoeck u. Ruprecht, Göttingen 1966, str. 258.

5. Vašíček A.: Measurement and Formation of Thin Films (in Czech). Publishing House of the Czech. Academy of Sciences, Prague, 1957.

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4. Electrical conduction in coevaporated antimony trisulphide films;Solid State Communications;1980-03

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