Measurements of the Dielectric Properties
Author:
Publisher
Springer London
Link
http://link.springer.com/content/pdf/10.1007/978-1-84882-507-9_8.pdf
Reference49 articles.
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3. Boughriet A, Legrand C, Chapoton A (1997) Noniterative stable transmission/reflection method for low-loss material complex permittivity determination. IEEE Trans Microw Theory and Tech 45:52–57
4. Buslov O, Keys V, Kozyrev A et al. (2003) Procedure of measurement of ferroelectric film parameters using open resonator method. Microwave and Telecommunication Technology CriMiCo2003:683–684
5. Carlsson E, Gevorgian S (1997) Effect of enhanced current crowding in a CPW with a thin ferroelectric film. Electron Lett 33:145–146
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