Further scanning electron microscope studies of GaP electroluminescent diodes-Reference-Cited by-同舟云学术

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Further scanning electron microscope studies of GaP electroluminescent diodes

Published:1980-05 Issue:5 Volume:15 Page:1276-1282
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Acuna Rojas C. M.,Holt D. B.,Yacobi B. G.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00551817.pdf

Reference23 articles.

1. D. B. Holt, in ?Quantitative Scanning Electron Microscopy?, edited by D. B. Holt, M. D. Muir, P. R. Grant and I. M. Boswarva (Academic Press, London, 1974) Ch. 8, pp. 213?86.

2. D. F. Kyser and D. B. Wittry, in ?The Electron Microprobe?, edited by T. D. McKinley, K. F. J. Heinrich and D. B. Wittry (Wiley, New York, 1964) pp. 691?714.

3. D. B. Wittry and D. F. Kyser, J. Appl. Phys. 36 (1965) 1387.

4. B. D. Chase and D. B. Holt, Phys. Stat. Sol. a19 (1973) 467.

5. D. B. Holt and B. D. Chase, ibid a20 (1973) 135.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Detrimental nonlocality in luminescence measurements;Journal of Applied Physics;2017-08-14

2. Diffusion-Limited Carrier Lifetime in Ga P:N LED;Physica Status Solidi (a);1983-06-16

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