Cryptanalysis of full round FUTURE with multiple biclique structures-Reference-Cited by-同舟云学术

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Cryptanalysis of full round FUTURE with multiple biclique structures

Published:2023-12-19 Issue: Volume: Page:
ISSN:1936-6442
Container-title:Peer-to-Peer Networking and Applications
language:en
Short-container-title:Peer-to-Peer Netw. Appl.

Author:

Roy Himadry Sekhar,Dey Prakash,Mondal Sandip Kumar,Adhikari Avishek

Funder

University Grants Commission

Department of Science and Technology, Ministry of Science and Technology, India

Publisher

Springer Science and Business Media LLC

Subject

Computer Networks and Communications,Software

Link

https://link.springer.com/content/pdf/10.1007/s12083-023-01600-y.pdf

Reference38 articles.

1. Biham E, Biryukov A, Shamir A (1999) Cryptanalysis of skipjack reduced to 31 rounds using impossible differentials. In Advances in Cryptology-EUROCRYPT’99: International Conference on the Theory and Application of Cryptographic Techniques Prague, Czech Republic, May 2–6, 1999 Proceedings 18, Springer, p 12–23

2. Bogdanov A, Khovratovich D, Rechberger C (2011) Biclique cryptanalysis of the full aes. In: Lee DH, Wang X (eds) Advances in Cryptology - ASIACRYPT 2011. Berlin, Heidelberg, Springer, Berlin Heidelberg, pp 344–371

3. Dey P, Adhikari A (2014) Improved multi-bit differential fault analysis of trivium. In: Meier W, Mukhopadhyay D (eds), Progress in Cryptology - INDOCRYPT 2014 - 15th International Conference on Cryptology in India, New Delhi, India, December 14-17, 2014, Proceedings, vol. 8885 of Lecture Notes in Computer Science, Springer, p 37–52

4. Dey P, Chakraborty A, Adhikari A, Mukhopadhyay D (2014) Multi-bit differential fault analysis of grain-128 with very weak assumptions. IACR Cryptol. ePrint Arch., p 654

5. Dey P, Chakraborty A, Adhikari A, Mukhopadhyay D (2015) Improved practical differential fault analysis of grain-128. In: Nebel W, Atienza D (eds), Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, ACM, p 459–464

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