Determination of trace impurities in electronic grade quartz: Comparison of inductively coupled plasma mass spectroscopy with other analytical techniques-Reference-Cited by-同舟云学术

Determination of trace impurities in electronic grade quartz: Comparison of inductively coupled plasma mass spectroscopy with other analytical techniques

Published:1989-05 Issue:3-6 Volume:99 Page:413-422
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Baumann Heinrich,Pavel Ji?�

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01244697.pdf

Reference15 articles.

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3. Data Sheet for Low Alpha Rays Grade Silica SH-1 and SW-C05, MICRON Co., Ltd., Himeji City, Hirohata-ku, Hyogo Prefecture, Japan, 1987.

4. D. J. Douglas, R. S. Houk,Prog. Anal. At. Spectrosc. 1985,8, 1.

5. A. L. Gray,Spectrochim. Acta 1985,40B, 1525.

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