Barriers to AEM: Contamination and Etching-Reference-Cited by-同舟云学术

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Barriers to AEM: Contamination and Etching

Published:1979 Issue: Volume: Page:481-505
ISSN:
Container-title:Introduction to Analytical Electron Microscopy
language:
Short-container-title:

Author:

Hren J. J.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4757-5581-7_18

Reference65 articles.

1. Ambrose, B. K., L. Holland and L. Laurenson, J. Microscopy 96 (1972) 389.

2. Bauer, B. and R. Speídel, Optik, 48 (1977) 237.

3. Broers, A. N., Microele. and Reliability, 4 (1963) 103.

4. Burton, E. F., R. S. Sennett and S. G. Ellis, Nature, 160 (1947) 565.

5. Calbick, C. J. and R. E. Hartman, Proc. Twenty Seventh Annual EMSA Meeting (1969) 82.

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