Investigation of Microscopic Strain by X-Ray Diffraction in Nb3Sn Tape Conductors Subjected to Compressive and Tensile Strains

Author:

Haken Bennie,Godeke Arno,Kate Herman H. J.

Publisher

Springer US

Reference8 articles.

1. J.W. Ekin, Strain scaling law for flux pinning in practical superconductors. Part 1: Basic relationship and application to Nb3Sn conductors Cryogenics 20:611 (1980).

2. B. ten Haken, A. Godeke and H.H.J. ten Kate, Thin influence of various strain components on the critical parameters of layer shaped Nb3Sn, Adv. in Cryo. Eng. (Materials) 40:875 (1993).

3. B. ten Haken, A. Godeke and H.H.J. ten Kate, The influence of Compressive and Tensile Axial strain on the critical properties of Nb3Sn conductors, ASC-94 Boston, USA, to be published in IEEE trans. on Superconductivity (1995).

4. B. ten Haken, A. Godeke and H.H.J. ten Kate, A reversible rise in the critical current of a Nb3Sn-bronze tape due to transverse pressure, EUCAS Edinburgh UK (1995).

5. M. Poirier et al., Elastic constants of polycrystaline NH3Sn between 4.2 and 300 K, J. Appl. Phys. 55:3327 (1984).

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