Laboratory Techniques for X-ray Reflection Topography-Reference-Cited by-同舟云学术

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Laboratory Techniques for X-ray Reflection Topography

Published:1980 Issue: Volume: Page:349-367
ISSN:
Container-title:Characterization of Crystal Growth Defects by X-Ray Methods
language:
Short-container-title:

Author:

Armstrong R. W.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4757-1126-4_14

Reference48 articles.

1. W. Berg (1931) Naturwissenschaften 19, 391

2. W. Berg (1931) Z. Krist. 89, 286

3. C.S. Barrett (1945) Trans AIME 161, 15

4. L.G. Schulz (1954) Trans AIME 200, 1082

5. U. Bonse (1958) Z. Phys. 153, 278 (1962) in Direct Observation of Imperfections in Crystals (eds. J.B. Newkirk and J.H. Wernick), Interscience Publishers, New York, p431

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06

2. Useful formulae;Dynamical Theory of X-Ray Diffraction;2003-11-06

3. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06

4. Preface;Dynamical Theory of X-Ray Diffraction;2003-11-06

5. Copyright Page;Dynamical Theory of X-Ray Diffraction;2003-11-06

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