Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method-Reference-Cited by-同舟云学术

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Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method

Published:1989 Issue: Volume: Page:279-284
ISSN:
Container-title:Advances in X-Ray Analysis
language:
Short-container-title:

Author:

Chaudhuri J.,Shah S.,Harbison J. P.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4757-9110-5_36

Reference6 articles.

1. W.J. Bartels, J. Vac. Sci Technol. B1 (2), Apr-June, 338 (1983).

2. W.H. Zachariasen, Theory of X-Ray Diffraction in Crystals (John Wiley and Sons, Inc., New York, 1945), pp. 147–175.

3. B.D. Cullity, Elements of X-Ray Diffraction (Addison-Wesley Publ. Co., Inc., Reading, Massachusetts, 1978), pp. 133–135.

4. J.J. Harris, B.A. Joyce, and P.J. Dobson, Surf. Sci. 103 (1), L90 (1981).

5. J.H. Neave, B.A. Joyce, P.J. Dobson, and N. Norton, Appl. Phys. A31, 1 (1983).

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