Data Mining by Attribute Decomposition with Semiconductor Manufacturing Case Study-Reference-Cited by-同舟云学术

Data Mining by Attribute Decomposition with Semiconductor Manufacturing Case Study

Published:2001 Issue: Volume: Page:311-336
ISSN:1569-2698
Container-title:Massive Computing
language:
Short-container-title:

Author:

Maimon Oded,Rokach Lior S.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4757-4911-3_13

Reference34 articles.

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5. Dietterich, T. G., and Michalski, R. S., “A comparative review of selected methods for learning from examples,” Machine Learning, an Artificial Intelligence approach, 1: 41–81, 1983.

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