Mapping Residual Plastic Strain in Materials Using Electron Backscatter Diffraction-Reference-Cited by-同舟云学术

Mapping Residual Plastic Strain in Materials Using Electron Backscatter Diffraction

Published:2000 Issue: Volume: Page:247-264
ISSN:
Container-title:Electron Backscatter Diffraction in Materials Science
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Author:

Lehockey Edward M.,Lin Yang-Pi,Lepik Olev E.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4757-3205-4_20

Reference18 articles.

1. Adams, B.L., Wright, S.L, and Kunze, K., 1993, Orientation imaging: the emergence of a new microscopy, Met. Trans. 24A:819.

2. ASTMa, 1996, Standard test methods for tension testing of metallic materials (metric), ASTM E 8, ASTM Annual Book of Standards, 3.01:55.

3. ASTMb, 1996, Standard practice for making and using c-ring stress-corrosion test specimens, ASTM G 38 – 73, ASTM Annual Book of Standards, 3.02:132.

4. ASTMC, 1996, Standard test method for microhardness of materials, ASTM E 384, ASTM Annual Book of Standards, 3.01:385.

5. Berenson, M.L., 1983, Intermediate Statistical Methods and Applications, Prentice Hall Publishing, New Jersey.

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