1. Akers, S.B.: Functional Testing with Binary Decision Diagrams; Proc. 8 th Symp. Fault Tol. Comp., pp. 75–82, 1978.
2. Prentice-Hall;JR Armstrong,1993
3. Barclay, D.S., Armstrong, J.R.: A Heuristic Chip-Level Test Generation Algorithm; 23rd Design Automation Conference, pp. 257–262, 1986.
4. Barclay, D.S., Armstrong, J.R.: A Heuristic Chip-Level Test Generation Algorithm; 23rd Design Automation Conference, pp. 257–262, 1986.
5. Bashford, S., Bieker, U., Harking, B., Leupers, R., Marwedel, P., Neumann, A., Voggenauer, A., Voggenauer, D.: The MIMOLA language 4.1; University Dortmund, Informatik 12, 1994.