Argon ion beam interaction on polyethylene terephthalate surface by a 4 kJ plasma focus device
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy
Link
http://link.springer.com/content/pdf/10.1007/s12043-015-1024-6.pdf
Reference20 articles.
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3. RETRACTED: Growth and characterization of GaN nanoparticles on P-type Si (100) substrate by plasma focus device with nitrogen plasma;International Journal of Hydrogen Energy;2017-03
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