How to Make a Device into a Product: Accelerated Life Testing (ALT), Its Role, Attributes, Challenges, Pitfalls, and Interaction with Qualification Tests-Reference-Cited by-同舟云学术

How to Make a Device into a Product: Accelerated Life Testing (ALT), Its Role, Attributes, Challenges, Pitfalls, and Interaction with Qualification Tests

Published: Issue: Volume: Page:B203-B231
ISSN:
Container-title:Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
language:
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Author:

Suhir E.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/0-387-32989-7_28.pdf

Reference25 articles.

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3. O. Svelto and D.C. Hanna, Principles of Lasers, Plenum, 1998.

4. E. Suhir, M. Fukuda, and C.R. Kurkjian, Eds., reliability of photonic materials and structures, Materials Research Society Symposia Proceedings, Vol. 531, 1998.

5. E. Suhir, R.C. Cammarata, D.D.L. Chung, and M. Jono, Mechanical behavior of materials and structures in microelectronics, Materials Research Society Symposia Proceedings, Vol. 226, 1991.

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