Backscattering analysis of the thermal diffusion of gold layers into amorphous semiconductor thin films-Reference-Cited by-同舟云学术

Backscattering analysis of the thermal diffusion of gold layers into amorphous semiconductor thin films

Published:1977-03 Issue:1-2 Volume:38 Page:43-49
ISSN:0134-0719
Container-title:Journal of Radioanalytical Chemistry
language:en
Short-container-title:J. Radioanal. Chem.

Author:

Marsaud S.,Thomas J. P.,Fallavier M.,Mackowski J. M.,Tousset J.

Publisher

Springer Science and Business Media LLC

Subject

Health, Toxicology and Mutagenesis,Public Health, Environmental and Occupational Health,Spectroscopy,Pollution,Radiology, Nuclear Medicine and imaging,Nuclear Energy and Engineering,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF02520182.pdf

Reference7 articles.

1. V.K.H. BIKTIMIROVA, B.I. BOLTAKS, Z.U. BORISOVA, T.D. DZHAFAROV, A.A. UBRAZTSOV, Fiz. Tekh. Poluprovodn, SSR, 11 (1974) 2174.

2. P. SUPTITZ, I. WILLERT, Phys. Stat. Sol., (A), 28 (1975) 223.

3. S. MARSAUD, Thèse de Spécialité (3ème cycle), Lyon, 1976.

4. J.M. MACKOWSKI, S. MARSAUD, J.P. THOMAS, P. KUMURDJIAN, 2ème Colloque International sur la Pulvérisation Cathodique, Nice, 18–21 mai 1976.

5. J.P. THOMAS, S. MARSAUD, M. FALLAVIER, Ion Beam Surface Layer Analysis, Vol. 1, (Eds O. MEYER, G. LINKER, F. KAPPELER), Plenum Press, N. Y., 1976.

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3. Bibliography section;Journal of Radioanalytical Chemistry;1978-03

4. Kinetics of drift and thermal diffusion of gold electrodes into amorphous semiconductor thin films;Nuclear Instruments and Methods;1978-02