Author:
Phromsuwan Udomchok,Sirisathitkul Yaowarat,Sirisathitkul Chitnarong,Muneesawang Paisarn,Uyyanonvara Bunyarit
Publisher
Springer Science and Business Media LLC
Subject
Physics and Astronomy (miscellaneous)
Reference17 articles.
1. S. Singh, M. Arora and R. Kishore, Estimation of measurement uncertainty in characterization of materials using transmission electron microscope (TEM) at NPL, India, MAPAN-J. Metrol. Soc. India, 22 (2007) 263–268.
2. N. Bonnet, Some trends in microscope image processing, Micron, 35 (2004) 635–653.
3. K.P. Chaudhary, C. Shakher and S.K. Singh, Measurement of the size and spacing of standard wire sieves using an image processing system and wavelet transform, MAPAN-J. Metrol. Soc. India, 26 (2011) 15-27.
4. K.S. Choudhari, P. Jidesh, P. Sudheendra and S.D. Kulkarni, Quantification and morphology studies of nanoporous alumina membranes: a new algorithm for digital image processing, Microsc. Microanal., 19 (2013) 1061–1072.
5. E.A. Wargo, T. Kotaka, Y. Tabuchi and E.C. Kumbur, Comparison of focused ion beam versus nano-scale X-ray computed tomography for resolving 3-D microstructures of porous fuel cell materials, J. Power Sources, 241 (2013) 608–618.
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