Publisher
Springer Science and Business Media LLC
Subject
Physics and Astronomy (miscellaneous)
Reference43 articles.
1. G. Binnig, H. Rohrer, C. Gerber and E. Weibel, Surface studies by scanning tunnelling microscopy, Phys. Rev. Lett., 49 (1982) 57–61.
2. G. Binnig, C.F. Quate and C. Gerber, Atomic force microscope, Phys. Rev. Lett., 56 (1986) 930–933.
3. F.J. Giessibl, Atomic force microscopy in ultrahigh vacuum, Jpn. J. Appl. Phys., 33 (1994) 3726–3734.
4. F.J. Giessibl, Advances in atomic force microscopy, Rev. Mod. Phys., 75 (2003) 949–983.
5. Y. Song, A.F. Otte, V. Shvarts, Z. Zhao, Y. Kuk, S.R. Blankenship, A. Band, F.M. Hess and J.A. Stroscio, Invited review article: a 10 mK scanning probe microscopy facility, Rev. Sci. Instrum., 81 (2011) 121101.
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献