The Effect of Thermal Stresses on the Electrical Resistance of Crimped Connections-Reference-Cited by-同舟云学术

The Effect of Thermal Stresses on the Electrical Resistance of Crimped Connections

Published:2022-06-18 Issue:1 Volume:38 Page:71-82
ISSN:0970-3950
Container-title:MAPAN
language:en
Short-container-title:MAPAN

Author:

Galliana F.^ORCID,Bellavia L.,Caria S. E.,Perta A. P.,Roccato P. E.

Abstract

AbstractCables headed with crimped lugs are frequently used in test laboratories in temperature rise tests carried out to validate electrical devices. The increase in the electrical resistance of the crimped connections can cause high dissipation of power and heat during these tests, impairing their outcome. This work evaluates the effect of thermal stresses on the resistance and on the dissipated power of crimped connections. This resistance was found to be more sensitive to thermal stresses than to mechanical ones analysed in a previous work. A limit of the dissipated power from crimped connections during temperature rise tests was estimated to be about 4 W corresponding to a crimp resistance of 24 μΩ for tests made at 400 A. Respecting these limits could avoid unnecessary rejections of equipment under test.

Funder

Istituto Nazionale di Ricerca Metrologica

Publisher

Springer Science and Business Media LLC

Subject

Physics and Astronomy (miscellaneous)

Link

https://link.springer.com/content/pdf/10.1007/s12647-022-00574-1.pdf

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5. Molex, Quality Crimp Handbook Rev.C, Release Date: 09-04-03, (2009) https://media.digikey.com/pdf/data%20sheets/molex%20pdfs/quality%20crimp%20handbook.pdf.

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