A knowledge-based image-inspection system for automatic defect recognition, classification, and process diagnosis
Author:
Publisher
Springer Science and Business Media LLC
Subject
Computer Science Applications,Computer Vision and Pattern Recognition,Hardware and Architecture,Software
Link
http://link.springer.com/content/pdf/10.1007/BF01211659.pdf
Reference20 articles.
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3. Butler KA, Corter JE (1986) Use of psychometric tools for knowledge. Addison-Wesley, Reading, Mass
4. Dom BE, Brecher VH, Bonner R, Batchelder JS, Jaffe RS (1988) The P300: a system for automatic patterned wafer inspection. Machine Vision Appl 4:205?221
5. Erenyi I, Pongracz J (1991) Quality control in the textile industry via machine vision. Microprocess microprogram 32:807?814
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