A real-time PCB defect detection model based on enhanced semantic information fusion
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Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s11760-024-03139-8.pdf
Reference42 articles.
1. Feng, B., Cai, J.: Pcb defect detection via local detail and global dependency information. Sensors (2023). https://doi.org/10.3390/s23187755
2. Dong, H., Qi, P., Han, J., Zhang, N., Long, C., Liao, S., Ye, C.: High-resolution magnetic imaging probe with staggered sensor arrays for small defects inspection. IEEE Sens J 23(17), 19153–19162 (2023). https://doi.org/10.1109/JSEN.2023.3294994
3. Jahn, N., Pfost, M.: Thermal onboard detection of voids in the solder layer between power semiconductor and pcb. IEEE Transact. Components, Packag. Manuf. Technol. 13(8), 1104–1112 (2023). https://doi.org/10.1109/TCPMT.2023.3299788
4. Chang, Y.-M., Lin, T.-L., Chi, H.-C., Lin, W.-K.: Deep learning-based aoi system for detecting component marks. In: 2023 IEEE International Conference on Big Data and Smart Computing (BigComp), pp. 243–247 (2023). https://doi.org/10.1109/BigComp57234.2023.00046
5. Wang, F., Zhou, Y., Zhang, X., Li, Z., Weng, J., Qiang, G., Chen, M., Wang, Y., Yue, H., Liu, J.: Laser-induced thermography: an effective detection approach for multiple-type defects of printed circuit boards (pcbs) multilayer complex structure. Measurement 206, 112307 (2023). https://doi.org/10.1016/j.measurement.2022.112307
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