A new method combining enhanced resolution and pattern identification

Author:

D’Acunto MarioORCID,Righi Marco,Salvetti Ovidio

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Signal Processing

Reference27 articles.

1. Gonzalez, R.C., Woods, R.E.: Digital Image Processing, vol. 3. Pearson, Prentice Hall (2008)

2. Theodorikis, S., Koutroumbas, K.: Pattern Recognition, vol. 4. Academic press, Cambridge (2008)

3. Bishop, C.M.: Pattern Recognition and Machine Learning. Springer, Berlin (2006)

4. D’Acunto, M.: Nanotribology and biomaterials: new challenges in atomic force microscopy. In: Gehar, K.S. (ed.) Nanophysics, Nanoclusters and Nanodevices, pp. 1–39. Nova Science publisher, New York (2006)

5. Kim, K.I., Kwon, Y.: Single-image super-resolution using sparse regression and natural image prior. IEEE Trans. Pattern Anal. Mach. Intell. 32, 1127–1133 (2010)

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