Author:
Kabán Ata,Tiňo Peter,Girolami Mark
Publisher
Springer Berlin Heidelberg
Cited by
2 articles.
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1. Improving Robustness of Logistic Regression under Label Noise;2021 IEEE International Conference on Technology, Research, and Innovation for Betterment of Society (TRIBES);2021-12-17
2. Label-Noise Robust Logistic Regression and Its Applications;Machine Learning and Knowledge Discovery in Databases;2012