Author:
Rueda Luis,Oommen B. John
Publisher
Springer Berlin Heidelberg
Reference19 articles.
1. M. Aladjem. Linear Discriminant Analysis for Two Classes Via Removal of Classification Structure. IEEE Trans. Pattern Analysis and Machine Intelligence, 19(2):187–192, 1997.
2. R. Duda and P. Hart. Pattern Classification arid Scene Analysis. John Wiley and Sons, Inc., 1973.
3. K. Fukunaga. Introduction to Statistical Pattern Recognition. Academic Press, 1990.
4. W. Krzanowski, P. Jonathan, W. McCarthy, and M. Thomas. Discriminant Analysis with Singular Covariance Matrices: Methods and Applications to Spectroscopic Data. Applied Statistics, 44:101–115, 1995.
5. C. Lau, editor. Neural Networks: Theoretical Foundations and Analysis. IEEE Press, 1992.