Case Base Management for Analog Circuits Diagnosis Improvement-Reference-Cited by-同舟云学术

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Case Base Management for Analog Circuits Diagnosis Improvement

Published:2003 Issue: Volume: Page:437-451
ISSN:0302-9743
Container-title:Case-Based Reasoning Research and Development
language:
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Author:

Pous Carles,Colomer Joan,Melendez Joaquim,de la Rosa Josep Lluís

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/3-540-45006-8_34

Reference13 articles.

1. Bandler, J., Salama, A.: Fault diagnosis of analog circuits. Proceedings of the IEEE 73 (1985) 1279–1325

2. Fenton, W.G., McGinnity, T.M., Maguire, L.P.: Fault diagnosis of electronic systems using intelligent techniques: A review. IEEE Transactions on Systems, Man and Cybernetics. Part C: Applications and Reviews 31 (2001) 269–281

3. Starzik, J., Pang, J., Manetti, S., Piccirilli, M., Fedi, G.: Finding ambiguity groups in low testability analog circuits. IEEE Transactions on Circuits and Systems. Fundamental Theory and Applications 47 (2000) 1125–1137

4. Stenbakken, G., Souders, T., Stewart, G.: Ambiguity groups and testability. IEEE Transactions on Instrumentation and Measurement 38 (1989) 941–947

5. Boyd, R.: Tolerance Analysis of Electronic Circuits Using Matlab. Electronics Engineering. CRC Press (1999) ISBN: 0-8493-2276-6.

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1. Introduction;Knowledge-Driven Board-Level Functional Fault Diagnosis;2016-08-20

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