High-Resolution Scanning Electron Microscopy-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

High-Resolution Scanning Electron Microscopy

Published: Issue: Volume: Page:325-359
ISSN:
Container-title:Handbook of Microscopy for Nanotechnology
language:
Short-container-title:

Author:

Liu Jingyue

Publisher

Kluwer Academic Publishers

Link

http://link.springer.com/content/pdf/10.1007/1-4020-8006-9_11.pdf

Reference55 articles.

1. M. Knoll, Z. Tech. Phys. 16 (1935) 497.

2. M. Von Ardenne, Z. Phys. 109 (1938) 553.

3. M. Von Ardenne, Z. Tech. Phys. 19 (1938) 407.

4. M. Knoll and R. Theile, Z. Phys. 113 (1939) 260.

5. V. K. Zworykin, J. Hillier, R. L. Snyder, ASTM Bulletin 117 (1942) 15.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Geological investigations and mineralogical characterization of the Awreith Gol Lead-Antimony Deposit, Chitral, Pakistan;Mining of Mineral Deposits;2023-12-30

2. A direct comparison of experimental methods to measure dimensions of synthetic nanoparticles;Ultramicroscopy;2017-11

3. Mapping the electrostatic potential of Au nanoparticles using hybrid electron holography;Ultramicroscopy;2016-06

4. Physical Vapor Deposition in Manufacturing;Handbook of Manufacturing Engineering and Technology;2014-09-30

5. Advance in dimensional measurements of nano-objects based on defocusing of the electron probe of a scanning electron microscope;SPIE Proceedings;2013-09-20

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3